Masahiro Horibe

Masahiro Horibe



National Metrology Institute of Japan (NMIJ) Umezono 1-1-1,Tsukuba, Ibaraki Japan 305-8563


  • Member, TC-3 MICROWAVE MEASUREMENTS, Technical Committees**


Masahiro Horibe received a Ph.D. degree in quantum engineering from Nagoya University, Nagoya, Japan, in 2001. He received the Japan Society for the Promotion of Science Postdoctoral Fellowship from 1999 to 2001. In 2001, he joined Fujitsu Limited, Kanagawa, Japan. From 2001 to 2003, he worked in the Superconductivity Research Laboratory, the International Superconductivity Technology Center, Tokyo, Japan. In 2003, he worked on carbon nanotube applications in Fujitsu Laboratories Ltd. In 2004, he has joined to the National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan. He was the first generation of group leader in the electromagnetic measurement group and works on the research and development of national metrology standards for scattering parameters and material characterization in the RF, microwave, millimeter-wave, and terahertz frequency ranges. He worked in the material characterization for nano-electronic materials, flexible electronic applications, characterization of RF high-power devices, and 6G related measurement technologies (on-ware measurements and material characterizations). In 2022, He is start to working to create national R&D project for quantum computing technology as a director for R&D coordination in the Ministry of Economy, Trade, and Industry, Industrial Science and Technology Policy and Environment Bureau, Research and Development division. He is now members of IEEE, ARFTG, IEEE MTT-3 technical committee, URSI Commission A, IEEE standard working group for RF technologies (P1785, 287, 1765, and 1770) and quantum computing technologies (P1913, 2995, 3120, 3155, 7130 and 7131). He is also an ISO17025 assessor for International Accreditation, Japan and an expert for standard development in Japan. He was the Japan national committee chair of the IEC TC46 and SC46F, sub-chair of the IEC TC 113 WG8 Japanese committee.

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